View SI53119_8393204.PDF datasheet online --- IC-ON-LINE

Datasheet File OCR Text:

rev. 1.1 12/15 copyright ? 2015 by silicon laboratories SI53119 SI53119 19-o utput pci e g en 3 buffer features applications description the SI53119 is a 19-output, low-power hcsl differential clock buffer that meets all of the performance requirements of the intel db1200zl specification. the device is optimized for distributing refere nce clocks for intel ? quickpath interconnect (intel qpi), pcie gen 1/gen 2/gen 3/ gen 4, sas, sata, and intel scalable memory interconn ect (intel smi) applications. the vco of the device is optimized to support 100 mhz and 133 mhz operation. each differential output can be enabled through i 2 c for maximum flexibility and power savi ngs. measuring pcie clock jitter is quick and easy with the silicon labs pcie clock jitter tool. download it for free at www.silabs.com/pcie-learningcenter . ? nineteen 0.7 v low-power, push- pull hcsl pcie gen 3 outputs ? 100 mhz /133 mhz pll operation, supports pcie and qpi ? pll bandwidth sw smbus programming overrides the latch value from hw pin ? 9 selectable smbus addresses ? smbus address configurable to allow multiple buffers in a single control network 3.3 v supply voltage operation ? separate vddio for outputs ? pll or bypass mode ? spread spectrum tolerable ? 1.05 to 3.3 v i/o supply voltage ? 50 ps output-to-output skew ? 50 ps cyc-cyc jitter (pll mode) ? low phase jitter (intel qpi, pcie gen 1/2/3/4 common clock compliant) ? gen 3 srns compliant ? 100 ps input-to-output delay ? extended temperature: ?40 to 85 c ? 72-pin qfn ? for variations of this device, contact silicon labs ? server ? storage ? data center ? enterprise switches and routers patents pending ordering information: see page 31. pin assignments SI53119 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 1 vdda gnda 100m_133m hbw_bypass_lbw pwrgd / pwrdn gnd vddr clk_in clk_in sa_0 sda scl sa_1 fbout_nc gnd dif_7 dif_7 dif_6 dif_6 gnd vdd dif_5 dif_5 dif_4 dif_4 gnd 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 dif_11 dif_11 dif_10 dif_10 gnd vdd vdd_io dif_9 dif_9 dif_8 dif_8 vdd_io 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 17 dif_0 dif_0 gnd dif_1 dif_1 gnd vdd vdd_io dif_2 dif_2 dif_3 dif_3 vdd_io vdd_io gnd vdd_io gnd gnd dif_12 dif_12 dif_13 dif_13 dif_14 dif_14 65 66 67 68 69 70 71 72 gnd dif_15 dif_15 dif_16 dif_16 dif_17 dif_17 dif_18 dif_18 fbout_nc
SI53119 2 rev. 1.1 functional block diagram fb_out dif_[18:0] ssc compatible pll control logic scl sda pwrgd / pwrdn sa_1 sa_0 hbw_bypass_lbw 100m_133 clk_in clk_in
SI53119 rev. 1.1 3 t able of c ontents section page 1. electrical specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 2. functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 2.1. clk_in, clk_in . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 2.2. 100m_133m?frequency selection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 2.3. sa_0, sa_1?address selection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 2.4. ckpwrgd/pwrdn . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 2.5. hbw_bypass_lbw . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 2.6. miscellaneous requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 3. test and measurement setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 3.1. input edge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 3.2. termination of differential outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 4. control registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 4.1. byte read/write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 4.2. block read/write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 4.3. control registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 5. pin descriptions: 72-pin qfn . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 6. power filtering example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 6.1. ferrite bead power filtering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 7. ordering guide . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 8. package outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 9. land pattern: 72-pin qfn . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 document change list . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
SI53119 4 rev. 1.1 1. electrical specifications table 1. dc operating characteristics v dd_a =3.3v5%, v dd =3.3v5% parameter symbol test condition min max unit 3.3 v core supply voltage vdd/vdd_a 3.3 v 5% 3.135 3.465 v 3.3 v i/o supply voltage 1 vdd_io 1.05 v to 3.3 v 5% 0.9975 3.465 v 3.3 v input high voltage v ih vdd 2.0 vdd+0.3 v 3.3 v input low voltage v il vss-0.3 0.8 v input leakage current 2 i il 0 < vin < vdd ?5 +5 a 3.3 v input high voltage 3 v ih_fs vdd 0.7 vdd+0.3 v 3.3 v input low voltage 3 v il_fs vss?0.3 0.35 v 3.3 v input low voltage v il_tri 0 0.9 v 3.3 v input med voltage v im_tri 1.3 1.8 v 3.3 v input high voltage v ih_tri 2.4 vdd v 3.3 v output high voltage 4 v oh i oh =?1ma 2.4 ? v 3.3 v output low voltage 4 v ol i ol =1ma ? 0.4 v input capacitance 5 c in 2.5 4.5 pf output capacitance 5 c out 2.5 4.5 pf pin inductance l pin ?7nh ambient temperature t a no airflow 0 70 c notes: 1. vdd_io applies to the low-power nmos push-pull hcsl compatible outputs. 2. input leakage current does not include inputs with pull-up or pull-down resistors. inputs with resistors should state current requirements. 3. internal voltage reference is to be used to guarantee v ih _fs and v il _fs threshold levels over full operating range. 4. signal edge is required to be monotonic when transitioning through this region. 5. ccomp capacitance based on pad metallization and silicon device capacitance. not including pin capacitance.
SI53119 rev. 1.1 5 table 2. smbus characteristics parameter symbol test condition min max unit smbus input low voltage 1 v ilsmb 0.8 v smbus input high voltage 1 v ihsmb 2.1 v ddsmb v smbus output low voltage 1 v olsmb @ i pullup 0.4 v nominal bus voltage 1 v ddsmb @ v ol 2.7 5.5 v smbus sink current 1 i pullup 3v to 5v +/-10% 4 ma sclk/sdat rise time 1 t rsmb (max v il ? 0.15) to (min v ih + 0.15) 1000 ns sclk/sdat fall time 1 t fsmb (min v ih + 0.15) to (max v il ? 0.15) 300 ns smbus operating frequency 1,2 f minsmb minimum operating frequency 100 khz notes: 1. guaranteed by design and characterization 2. the differential input clock must be running for the smbus to be active table 3. current consumption t a = 0?70 c; supply voltage v dd =3.3v 5% parameter symbol test c ondition min typ max unit operating current idd vdd 100 mhz, vdd rail ? 25 35 ma idd vdda 100 mhz, vdda + vddr, pll mode ? 16 20 ma idd vddio 100 mhz, cl = full load, vdd io rail ? 130 150 ma power down current idd vddpd power down, vdd rail ? 1.5 2 ma idd vddapd power down, vdda rail ? 8 12 ma idd vddiopd power down, vdd_io rail ? 0.17 0.5 ma
SI53119 6 rev. 1.1 table 4. clock input parameters t a = 0?70 c; supply voltage v dd =3.3v 5% parameter symbol test condition min typ max unit input high voltage v ihdif differential inputs (singled-ended measurement) 600 700 1150 mv input low voltage v ihdif differential inputs (singled-ended measurement) vss- 300 0300mv input common mode voltage v com common mode input voltage 300 1000 mv input amplitude, clk_in v swing peak to peak value 300 1450 mv input slew rate, clk_in dv/dt measured differentially 0.4 8 v/ns input duty cycle measurement from differential wave form 45 50 55 % input jitter?cycle to cycle j dfin differential measurement 125 ps input frequency f ibyp vdd = 3.3 v, bypass mode 33 150 mhz f ipll vdd = 3.3 v, 100 mhz pll mode 90 100 110 mhz fipll vdd = 3.3 v, 133.33 mhz pll mode 120 133.33 147 mhz input ss modulation rate fmodin triangle wave modulation 30 31.5 33 khz
SI53119 rev. 1.1 7 table 5. output skew, pll bandwidth and peaking t a = 0?70 c; supply voltage v dd =3.3v 5% parameter test condition min typ max unit clk_in, dif[x:0] input-to-ou tput delay in pll mode nominal value 1,2,3,4 ?100 18 100 ps clk_in, dif[x:0] input-to-o utput delay in bypass mode nominal value 2,4,5 2.5 3.6 4.5 ns clk_in, dif[x:0] input- to-output delay variation in pll mode over voltage and temperature 2,4,5 ?50 20 50 ps clk_in, dif[x:0] input-to-output de lay variation in bypass mode over voltage and temperature 2,4,5 ?250 250 ps dif[11:0] output-to-output sk ew across all 19 outputs (common to bypass and pll mode) 1,2,3,4,5 0 20 50 ps pll jitter peak ing (hbw_bypass_lbw =0) 6 ? 0.4 2.0 db pll jitter peak ing (hbw_bypass_lbw =1) 6 ?0.12.5db pll bandwidth (hbw_bypass_lbw =0) 7 ?0.71.4 mhz pll bandwidth (hbw_bypass_lbw =1) 7 ?2 4 mhz notes: 1. measured into fixed 2 pf load cap. input-to-output ske w is measured at the first output edge following the corresponding input. 2. measured from differential cross-point to differential cross-point. 3. this parameter is deterministic for a given device. 4. measured with scope averaging on to find mean value. 5. all bypass mode input-to-output specs re fer to the timing between an input edg e and the specific output edge created by it. 6. measured as maximum pass band gain. at frequencies within th e loop bw, highest point of magnification is called pll jitter peaking. 7. measured at 3 db down or half power point.
SI53119 8 rev. 1.1 table 6. phase jitter parameter test condition min typ max unit phase jitter pll mode pcie gen 1, common clock 1,2,3 ?2586ps pcie gen 2 low band, common clock f < 1.5 mhz 1,3,4,5 ? 2.5 3.0 ps (rms) pcie gen 2 high band, common clock 1.5 mhz < f < nyquist 1,3,4,5 ? 2.5 3.1 ps (rms) pcie gen 3, common clock (pll bw 2?4 mhz, cdr = 10 mhz) ? 0.5 1.0 ps (rms) pcie gen 3 separate refe rence no spread, srns (pll bw of 2?4 or 2?5 mhz, cdr = 10 mhz) 1,3,4,5 ? 0.35 0.71 ps (rms) pcie gen 4, common clock (pll bw of 2?4 or 2?5 mhz, cdr = 10 mhz) 1,4,5,8 ?0.51.0ps (rms) intel ? qpi & intel smi (4.8 gbps or 6.4 gb/s, 100 or 133 mhz, 12 ui) 1,6,7 ? 0.25 0.5 ps (rms) intel qpi & intel smi (8 gb/s, 100 mhz, 12 ui) 1,6 ? 0.15 0.3 ps (rms) intel qpi & intel smi (9.6 gb/s, 100 mhz, 12 ui) 1,6 ? 0.16 0.2 ps (rms) notes: 1. post processed evaluation through intel supplied matlab* scrip ts. defined for a ber of 1e-12. measured values at a smaller sample size have to be extrapolated to this ber target. 2. = 0.54 implies a jitter peaking of 3 db. 3. pcie* gen 3 filter characteristics are subject to final ratifica tion by pcisig. check th e pci-sig for the latest specification. 4. measured on 100 mhz pcie output using the template fi le in the intel-supplied clock jitter tool v1.6.3. 5. measured on 100 mhz output using t he template file in the intel-su pplied clock jitter tool v1.6.3. 6. measured on 100 mhz, 133 mhz output using the template file in the intel-supplied clock jitter tool v1.6.3. 7. these jitter numbers are defined for a ber of 1e-12. measured numbers at a smaller sample size have to be extrapolated to this ber target. 8. gen 4 specifications based on the pci-ex press base specification 4.0 rev. 0.5. 9. download the silicon labs pcie clock jitter tool at www.silabs.com/pcie-learningcenter .
SI53119 rev. 1.1 9 additive phase jitter bypass mode pcie gen 1 1,2,3 ?10?ps pcie gen 2 low band f < 1.5 mhz 1,3,4,5 ?1.0? ps (rms) pcie gen 2 high band 1.5 mhz < f < nyquist 1,3,4,5 ?1.0? ps (rms) pcie gen 3 (pll bw 2?4 mhz, cdr = 10 mhz) 1,3,4,5 ?0.3? ps (rms) pcie gen 4, common clock (pll bw of 2?4 or 2?5 mhz, cdr = 10 mhz) 1,4,5,8 ?0.3? ps (rms) intel qpi & intel? smi (4.8 gbps or 6.4 gb/s, 100 or 133 mhz, 12 ui) 1,6,7 ?0.15? ps (rms) intel qpi & intel? smi (8 gb/s, 100 mhz, 12 ui) 1,6 ?0.1? ps (rms) intel qpi & intel? smi (9.6 gb/s, 100 mhz, 12 ui) 1,6 ?0.1? ps (rms) table 6. phase jitter (continued) notes: 1. post processed evaluation through intel supplied matlab* scrip ts. defined for a ber of 1e-12. measured values at a smaller sample size have to be extrapolated to this ber target. 2. = 0.54 implies a jitter peaking of 3 db. 3. pcie* gen 3 filter characteristics are subject to final ratifica tion by pcisig. check th e pci-sig for the latest specification. 4. measured on 100 mhz pcie output using the template fi le in the intel-supplied clock jitter tool v1.6.3. 5. measured on 100 mhz output using t he template file in the intel-su pplied clock jitter tool v1.6.3. 6. measured on 100 mhz, 133 mhz output using the template file in the intel-supplied clock jitter tool v1.6.3. 7. these jitter numbers are defined for a ber of 1e-12. measured numbers at a smaller sample size have to be extrapolated to this ber target. 8. gen 4 specifications based on the pci-ex press base specification 4.0 rev. 0.5. 9. download the silicon labs pcie clock jitter tool at www.silabs.com/pcie-learningcenter .
SI53119 10 rev. 1.1 table 7. dif 0.7 v ac timing characteristics (non-spread spectrum mode) 1 parameter symbol clk 100 mhz, 133 mhz unit min typ max clock stabilization time 2 t stab ? 1.5 1.8 ms long term accuracy 3,4,5 l acc ? ? 100 ppm absolute host clk period (100 mhz) 3,4,6 t abs 9.94900 ? 10.05100 ns absolute host clk period (133 mhz) 3,4,6 t abs 7.44925 ? 7.55075 ns slew rate 3,4,7 edge_rate 1.0 3.0 4.0 v/ns rise time variation 3,8,9 ? trise ? ? 125 ps fall time variation 3,8,9 ? tfall ? ? 125 ps rise/fall matching 3,8,10,11 t rise_mat / t fall_mat ?720% voltage high (typ 0.7 v) 3,8,12 v high 660 750 850 mv notes: 1. unless otherwise noted, all spec ifications in this table apply to all processor frequencies. 2. this is the time from the valid clk_in input clocks and the assertion of the pwrgd signal level at 1.8?2.0 v to the time that stable clocks are output from the buffer chip (pll locked). 3. test configuration is rs = 33.2 ? , 2 pf for 100 ? transmission line; rs = 27 ? , 2 pf for 85 ? transmission line. 4. measurement taken from differential waveform. 5. using frequency counter with the m easurement interval equal or greater than 0.15 s, target frequencies are 99,750,00 hz, 133,000,000 hz. 6. the average period over any 1 s period of time must be greater than the minimum and less than the maximum specified period. 7. measure taken from differential waveform on a component test board. the edge (slew) rate is measured from ?150 mv to +150 mv on the differential waveform. scope is set to average because the scope sample clock is making most of the dynamic wiggles along the clock edge. only valid for rising clock and falling clock . signal must be monotonic through the vol to voh region for trise and tfall. 8. measurement taken from single-ended waveform. 9. measured with oscilloscope, averaging off, using min max statistics. variation is the delta between min and max. 10. measured with oscilloscope, averaging on. the difference between the rising edge rate (average) of clock verses the falling edge rate (average) of clock . 11. rise/fall matching is derived using the following, 2*(trise ? tfall) / (trise + tfall). 12. vhigh is defined as the statistical average high value as obtained by using the oscilloscope vhigh math function. 13. vlow is defined as the statistical average low value as obtained by using the oscilloscope vlow math function. 14. measured at crossing point where the instantaneous voltage value of the rising edge of clk equals the falling edge of clk . 15. this measurement refers to the total vari ation from the lowest crossing point to the highest, regardless of which edge is crossing. 16. the crossing point must meet the absolute and relati ve crossing point specifications simultaneously. 17. vcross(rel) min and max are derived using the following, vc ross(rel) min = 0.250 + 0.5 (vhavg ? 0.700), vcross(rel) max = 0.550 ? 0.5 (0.700 ? vhavg), (see figures 3?4 for further clarification). 18. ? vcross is defined as the total variation of all cr ossing voltages of rising clock and falling clock . this is the maximum allowed variance in vcro ss for any particular system. 19. overshoot is defined as the absolute value of the maximum voltage. 20. undershoot is defined as the absolute value of the minimum voltage.
SI53119 rev. 1.1 11 voltage low (typ 0.7 v) 3,8,13 v low ?150 15 150 mv maximum voltage 8 v max ? 850 1150 mv minimum voltage v min ?300 ? ? mv absolute crossing point voltages 3,8,14,15,16 vox abs 300 450 550 mv total variation of vcross over all edges 3,8,18 to ta l ? vox ?14140 mv duty cycle 3,4 dc 45 ? 55 % maximum voltage (overshoot) 3,8,19 v ovs ??v high + 0.3 v maximum voltage (undershoot) 3,8,20 v uds ??v low ? 0.3 v ringback voltage 3,8 v rb 0.2 ? n/a v table 7. dif 0.7 v ac timing characteristics (non-spread spectrum mode) 1 (continued) parameter symbol clk 100 mhz, 133 mhz unit min typ max notes: 1. unless otherwise noted, all spec ifications in this table apply to all processor frequencies. 2. this is the time from the valid clk_in input clocks and the assertion of the pwrgd signal level at 1.8?2.0 v to the time that stable clocks are output from the buffer chip (pll locked). 3. test configuration is rs = 33.2 ? , 2 pf for 100 ? transmission line; rs = 27 ? , 2 pf for 85 ? transmission line. 4. measurement taken from differential waveform. 5. using frequency counter with the m easurement interval equal or greater than 0.15 s, target frequencies are 99,750,00 hz, 133,000,000 hz. 6. the average period over any 1 s period of time must be greater than the minimum and less than the maximum specified period. 7. measure taken from differential waveform on a component test board. the edge (slew) rate is measured from ?150 mv to +150 mv on the differential waveform. scope is set to average because the scope sample clock is making most of the dynamic wiggles along the clock edge. only valid for rising clock and falling clock . signal must be monotonic through the vol to voh region for trise and tfall. 8. measurement taken from single-ended waveform. 9. measured with oscilloscope, averaging off, using min max statistics. variation is the delta between min and max. 10. measured with oscilloscope, averaging on. the difference between the rising edge rate (average) of clock verses the falling edge rate (average) of clock . 11. rise/fall matching is derived using the following, 2*(trise ? tfall) / (trise + tfall). 12. vhigh is defined as the statistical average high value as obtained by using the oscilloscope vhigh math function. 13. vlow is defined as the statistical average low value as obtained by using the oscilloscope vlow math function. 14. measured at crossing point where the instantaneous voltage value of the rising edge of clk equals the falling edge of clk . 15. this measurement refers to the total vari ation from the lowest crossing point to the highest, regardless of which edge is crossing. 16. the crossing point must meet the absolute and relati ve crossing point specifications simultaneously. 17. vcross(rel) min and max are derived using the following, vc ross(rel) min = 0.250 + 0.5 (vhavg ? 0.700), vcross(rel) max = 0.550 ? 0.5 (0.700 ? vhavg), (see figures 3?4 for further clarification). 18. ? vcross is defined as the total variation of all cr ossing voltages of rising clock and falling clock . this is the maximum allowed variance in vcro ss for any particular system. 19. overshoot is defined as the absolute value of the maximum voltage. 20. undershoot is defined as the absolute value of the minimum voltage.
SI53119 12 rev. 1.1 table 10. absolute maximum ratings table 8. clock periods differential clock outputs with ssc disabled ssc off center freq, mhz measurement window unit 1 clock 1s 0.1s 0.1s 0.1s 1s 1 clock ?c-c jitter absper min ?ssc short term avg min ?ppm long term avg min 0ppm period nominal +ppm long term avg max +ssc short term avg max +c-c jitter absper max 100.00 9.94900 9.99900 10.00000 10.00100 10.05100 ns 133.33 7.44925 7.49925 7.50000 7.50075 7.55075 ns table 9. clock periods differential clock outputs with ssc enabled ssc on center freq, mhz measurement window unit 1 clock 1s 0.1s 0.1s 0.1s 1s 1 clock ?c-c jitter absper min ?ssc short term avg min ?ppm long term avg min 0ppm period nominal +ppm long term avg max +ssc short term avg max +c-c jitter absper max 99.75 9.94906 9.99906 10.02406 10.02506 10.02607 10.05107 10.10107 ns 133.33 7.44930 7.49930 7.51805 7.51880 7.51955 7.53830 7.58830 ns parameter symbol min max unit 3.3 v core supply voltage 1 vdd/vdd_a ? 4.6 v 3.3 v i/o supply voltage 1 vdd_io ? 4.6 v 3.3 v input high voltage 1,2 vih ? 4.6 v 3.3 v input low voltage 1 vil ? 0.5 ? v storage temperature 1 t s ?65 150 c input esd protection 3 esd 2000 ? v notes: 1. consult manufacturer regarding extended operation in excess of normal dc operating parameters. 2. maximum vih is not to exceed maximum v dd . 3. human body model.
SI53119 rev. 1.1 13 2. functional description 2.1. clk_in, clk_in the differential input clock is expected to be sourced from a clock synthesizer or pch. 2.2. 100m_133m ?frequency selection the SI53119 is optimized for lowest phase jitter perf ormance at operating frequencies of 100 and 133 mhz. 100m_133m is a hardware input pin, which programs the appro priate output frequency of the differential outputs. note that the clk_in frequency must be equal to th e clk_out frequency; meaning SI53119 is operated in 1:1 mode only. frequency selection can be enabled by the 100m_133m hardware pin. an external pull-up or pull-down resistor is attached to this pin to select the input/output frequency. the functionality is summarized in table 11. note: all differential outputs transition from 100 to 133 mhz or from 133 to 100 mhz in a glitch free manner. 2.3. sa_0, sa_1? address selection sa_0 and sa_1 are tri-level hardware pins, which program the appropriate address for the SI53119. the two tri- level input pins that can configure the device to nine different addresses. table 11. frequency program table 100m_133m optimized frequency (dif_in = dif_x) 0133.33mhz 1100.00mhz table 12. smbus address table sa_1 sa_0 smbus address lld8 lmda lhde mlc2 mmc4 mhc6 hlca hmcc hhce
SI53119 14 rev. 1.1 2.4. ckpwrgd/pwrdn ckpwrgd is asserted high and deassert ed low. deassertion of pwrgd (pullin g the signal low) is equivalent to indicating a power down condition. ckpwrgd (assertion) is used by the SI53119 to sample initial configurations, such as frequency select condition and sa selections. after ckpwrgd has been asserted high for the first time, the pin becomes a pwrdn (power down) pin that can be used to shut off all clocks cleanly and instruct the device to invoke power-saving mode. pwrdn is a completely asynchronous active low input. when entering power- saving mode, pwrdn should be asserted low prior to shutting off th e input clock or power to ensure all clocks shut down in a glitch free manner. when pwrdn is asserted low, all clocks will be di sabled prior to turning off the vco. when pwrdn is deasserted high, all clocks will start and stop without any abno rmal behavior and will meet all ac and dc parameters. note: the assertion and deassertion of pwrdn is absolutely asynchronous. warning: disabling of the clk_in input clock prior to assertion of pwrdn is an undefined mode and not recommended. oper- ation in this mode may result in glit ches, excessive frequency shifting, etc. 2.4.1. pwrdn assertion when pwrdn is sampled low by two consecutive rising edges of dif , all differential outputs must be held low/ low on the next dif high-to-low transition. figure 1. pwrdn assertion table 13. ckpwrgd/pwrdn functionality ckpwrgd/ pwrdn dif_in/ dinf_in# smbus en bit dif-x/ dif_x# fbout_nc/ fbout_nc# pll state 0 x x low/low low/low off 1 running 0 low/low running on 1 running running on pwrdwn dif dif
SI53119 rev. 1.1 15 2.4.2. ckpwrgd assertion the powerup latency is to be less than 1.8 ms. this is th e time from a valid clk_in input clock and the assertion of the pwrgd signal to the time that stable clocks are output from the device (pll locked). all differential outputs stopped in a low/low condition result ing from power down must be driven high in less than 300 s of pwrdn deassertion to a voltage greater than 200 mv. figure 2. pwrdg assertion (pwrdown?deassertion) 2.5. hbw_bypass_lbw the hbw_bypass_lbw pin is a tri-level function input pin (refer to table 1 for vil_tri, vim_tri, and vih_tri signal levels). it is used to select between pll high-bandwidth, pll bypass mode, or pll low-bandwidth mode. in pll bypass mode, the input clock is passed directly to the output stage, which may result in up to 50 ps of additive cycle-to-cycle jitter (50 ps + input jitter) on the differential outputs. in pll mode, the input clock is passed through a pll to reduce high-frequency jitter. the pll hbw, bypass, and pll lbw mode s may be selected by asserting the hbw_bypass_lbw input pin to the appropriate level described in table 14. the SI53119 has the abilit y to override the latch value of the pll op erating mode from hardwar e strap pin 5 via the use of byte 0 and bits 2 and 1. byte 0 bit 3 must be set to 1 to allow the user to change bits 2 and 1, affecting the pll. bits 7 and 6 will always read ba ck the original latched value. a warm reset of the system will have to be accomplished if the user changes these bits. table 14. pll bandwidth and readback table hbw_bypass_lbw pin mode byte 0, bit 7 byte 0, bit 6 llbw00 m bypass 0 1 hhbw11 tstable <1.8 ms tdrive_pwrdn# <300 s; > 200 mv dif dif pwrgd
SI53119 16 rev. 1.1 2.6. miscellaneous requirements data transfer rate: 100 kbps (standard mode) is the base func tionality required. fast mode (400 kbps) functionality is optional. logic levels: smbus logic levels are based on a percentage of v dd for the controller and other devices on the bus. assume all devices are based on a 3.3 v supply. clock stretching: the clock buffer must not hold/stretch the scl or sda lines low for more than 10 ms. clock stretching is discouraged and should on ly be used as a last resort. stretc hing the clock/data lines for longer than this time puts the device in an error/time-out mode and may not be supported in all platforms. it is assumed that all data transfers can be completed as specifie d without the use of cl ock/data stretching. general call: it is assumed that the clock buffer will no t have to respond to the ?general call.? electrical characteristics: all electrical characteristics must meet the standard mode specifications found in section 3 of the smbus 2.0 specification. pull-up resistors: any internal resistor pull-ups on the sdata and sclk inputs must be stated in the individual datasheet. the use of internal pull-ups on these pins of below 100 k is discouraged. assume that the board designer will use a single external pu ll-up resistor for each line and th at these values are in the 5?6 k ? range. assume one smbus device per dimm (serial presence detect), one smbus controller, one clock buffer, one clock driver plus one/two more smbus devices on th e platform for capacitive loading purposes. input glitch filters: only fast mode smbus device s require input glitch filters to suppress bus noise. the clock buffer is specified as a standard mode device and is not re quired to support this featur e. however, it is considered a good design practice to include the filters. pwrdn : if a clock buffer is placed in pwrdn mode, the sdata and sclk inputs must be tri-stated and the device must retain all programming in formation. idd current due to the smbu s circuitry must be characterized and in the data sheet.
SI53119 rev. 1.1 17 3. test and measurement setup 3.1. input edge input edge rate is based on single-ended measurement. this is the minimum input edg e rate at which the SI53119 is guaranteed to meet all performance specifications. 3.1.1. measurement points for differential figure 3. measurement points for rise time and fall time figure 4. single-ended measurement points for v ovs , v uds , v rb table 15. input edge rate frequency min max unit 100 mhz 0.35 n/a v/ns 133 mhz 0.35 n/a v/ns +150 mv -150 mv slew_rise +150 mv -150 mv slew_fall 0.0 v v_swing 0.0 v diff vovs vhigh vrb vlow vrb vuds
SI53119 18 rev. 1.1 figure 5. differential (clock?clock ) measurement points (t period , duty cycle, jitter) 3.2. termination of differential outputs all differential outputs are to be tested into a 100 ? or 85 ? differential impedance transmission line. source terminated clocks have some inherent limitations as to the maximum trace length and frequencies that can be supported. for cpu outputs, a maximum trace length of 10? and a maximum of 200 mhz are assumed. for src clocks, a maximum trace length of 16? and maximum freq uency of 100 mhz is assumed. for frequencies beyond 200 mhz, trace lengths must be restrict ed to avoid signal integrity problems. 3.2.1. termination of differential nmos push-pull type outputs figure 6. 0.7 v configuration test load board termination for nmos push-pull table 16. differential output termination clock board trace impedance rs rp unit diff clocks?50 ? configuration 100 33+ 5% n/a ? diff clocks?43 ? configuration 85 27+ 5% n/a ? tperiod low duty cycle % high duty cycle % skew measurement point 0.000 v t-line 10" typical t-line 10" typical receiver 2 pf 2 pf source terminated rs rs clock clock # SI53119
SI53119 rev. 1.1 19 4. control registers 4.1. byte read/write reading or writing a register in an smbus slave device in byte mode always involv es specifying the register number. 4.1.1. byte read the standard byte read is as shown in figure 7. it is an extension of the byte write. the write start condition is repeated; then, the slave device starts sending data, and th e master acknowledges it until the last byte is sent. the master terminates the transfer with a nak, then a stop condition. for byte operation, the 2 x 7th bit of the command byte must be set. for block operations, the 2 x 7th bit must be reset. if the bit is not set, the next byte must be the byte transfer count. figure 7. byte read protocol 4.1.2. byte write figure 8 illustrates a simple, typical byte write. for byte operati on, the 2 x 7th bit of the command byte must be set. for block operations, the 2 x 7th bit must be reset. if the bit is not set, the next byte must be the by te transfer count. the count can be between 1 and 32. it is not allowed to be zero or to exceed 32. figure 8. byte write protocol slave t wr a command slave a rd data byte 0 n p a r command start condition byte read protocol acknowledge repeat start not ack stop condition register # to read 2 x 7 bit = 1 1711 8 117 1 1811 master to slave to slave t wr a command data byte 0 a command start condition byte write protocol acknowledge register # to write 2 x 7 bit = 1 1711 8 1 8 1 1 master to slave to a p stop condition
SI53119 20 rev. 1.1 4.2. block read/write 4.2.1. block read after the slave address is sent with the r/w condition bit set, the command byte is sent with the msb = 0. the slave acknowledges the register index in the command by te. the master sends a repeat start function. after the slave acknowledges this, the slave s ends the number of bytes it wants to transfer (>0 and <33). the master acknowledges each byte except the last and sends a stop function. figure 9. block read protocol 4.2.2. block write after the slave address is sent with the r/w condition bi t not set, the command byte is sent with the msb = 0. the lower seven bits indicate the register at which to start the transfer. if the command byte is 00h, the slave device will be compatible with existing block mode slave devices. the next byte of a write must be the count of bytes that the master will transfer to the slave device. the byte count must be greater than zero and less than 33. following this byte are the data bytes to be transferred to the slave device. the slave device alwa ys acknowledges each byte received. the transfer is terminated after the slav e sends the ack and the mast er sends a stop function. figure 10. block write protocol slave t wr a command code command start condition block read protocol acknowledge repeat start register # to read 2 x 7 bit = 1 1711 8 master to slave to slave a rd a r 11 7 1 1 data byte a data byte 0 a data byte 1 n p 8181811 not acknowledge stop condition slave address t wr a command command bit start condition block write protocol acknowledge register # to write 2 x 7 bit = 0 1711 8 master to slave to a 1 data byte 0 a data byte 1 a p 181811 stop condition byte count = 2 a 8
SI53119 rev. 1.1 21 4.3. control registers table 17. byte 0: frequency select, output enable, pll mode control register bit description if bit = 0 if bit = 1 type default output(s) affected 0 100m_133m# frequency select 133 mhz 100 mhz r latched at power up dif[11:0] 1 reserved 0 2 reserved 0 3 output enable dif 16 low/low enable rw 1 dif_16 4 output enable dif 17 low/low enable rw 1 dif_17 5 output enable dif 18 low/low enable rw 1 dif_18 6 pll mode 0 see pll operating mode readback table r latched at power up 7 pll mode 1 see pll operating mode readback table r latched at power up table 18. byte 1: output enable control register bit description if bit = 0 if bit = 1 type default output(s) affected 0 output enable dif 0 low/low enabled rw 1 dif[0] 1 output enable dif 1 low/low enabled rw 1 dif[1] 2 output enable dif 2 low/low enabled rw 1 dif[2] 3 output enable dif 3 low/low enabled rw 1 dif[3] 4 output enable dif 4 low/low enabled rw 1 dif[4] 5 output enable dif 5 low/low enabled rw 1 dif[5] 6 output enable dif 6 low/low enabled rw 1 dif[6] 7 output enable dif 7 low/low enabled rw 1 dif[7]
SI53119 22 rev. 1.1 table 19. byte 2: output enable control register bit description if bit = 0 if bit = 1 type default output(s) affected 0 output enable dif 8 lo w/low enabled rw 1 dif[8] 1 output enable dif 9 low /low enabled rw 1 dif[9] 2 output enable dif 10 low/low enabled rw 1 dif[10] 3 output enable dif 11 low/ low enabled rw 1 dif[11] 4 output enable dif 12 low/low enabled rw 1 dif[112 5 output enable dif 13 low/low enabled rw 1 dif[14] 6 output enable dif 14 low/low enabled rw 1 dif[15] 7 output enable dif 15 low/low enabled rw 1 dif[16 table 20. byte 3: reserved control register bit description if bit = 0 if bit = 1 type default output(s) affected 0 reserved 0 1 reserved 0 2 reserved 0 3 reserved 0 4 reserved 0 5 reserved 0 6 reserved 0 7 reserved 0
SI53119 rev. 1.1 23 table 21. byte 4: reserved control register bit description if bit = 0 if bit = 1 type default output(s) affected 0 reserved 0 1 reserved 0 2 reserved 0 3 reserved 0 4 reserved 0 5 reserved 0 6 reserved 0 7 reserved 0 table 22. byte 5: vendor/revision identification control register bit description if bit = 0 if bit = 1 type default output(s) affected 0 vendor id bit 0 r vendor specific 0 1 vendor id bit 1 r vendor specific 0 2 vendor id bit 2 r vendor specific 0 3 vendor id bit 3 r vendor specific 1 4 revision code bit 0 r vendor specific 0 5 revision code bit 1 r vendor specific 0 6 revision code bit 2 r vendor specific 0 7 revision code bit 3 r vendor specific 0
SI53119 24 rev. 1.1 table 23. byte 6: device id control register bit description if bit = 0 if bi t = 1 type default output(s) affected 0 device id 0 r 0 1 device id 1 r 1 2 device id 2 r 1 3 device id 3 r 1 4 device id 4 r 0 5 device id 5 r 1 6 device id 6 r 1 7 device id 7 (msb) r 1
SI53119 rev. 1.1 25 table 24. byte 7: byte count register bit description if bit = 0 if bi t = 1 type default output(s) affected 0 bc0 - writing to this register con- figures how many bytes will be read back rw 0 1 bc1 -writing to this register con- figures how many bytes will be read back rw 0 2 bc2 -writing to this register con- figures how many bytes will be read back rw 0 3 bc3 -writing to this register con- figures how many bytes will be read back rw 1 4 bc4 -writing to this register con- figures how many bytes will be read back rw 0 5 reserved 0 6 reserved 0 7 reserved 0
SI53119 26 rev. 1.1 5. pin descriptions: 72-pin qfn SI53119 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 1 vdda gnda 100m_133m hbw_bypass_lbw pwrgd / pwrdn gnd vddr clk_in clk_in sa_0 sda scl sa_1 fbout_nc gnd dif_7 dif_7 dif_6 dif_6 gnd vdd dif_5 dif_5 dif_4 dif_4 gnd 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 dif_11 dif_11 dif_10 dif_10 gnd vdd vdd_io dif_9 dif_9 dif_8 dif_8 vdd_io 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 17 dif_0 dif_0 gnd dif_1 dif_1 gnd vdd vdd_io dif_2 dif_2 dif_3 dif_3 vdd_io vdd_io gnd vdd_io gnd gnd dif_12 dif_12 dif_13 dif_13 dif_14 dif_14 65 66 67 68 69 70 71 72 gnd dif_15 dif_15 dif_16 dif_16 dif_17 dif_17 dif_18 dif_18 fbout_nc
SI53119 rev. 1.1 27 table 25. SI53119 72-pin qfn descriptions pin # name type description 1vdda 3.3 v 3.3 v power supply for pll. 2 gnda gnd ground for pll. 3 100m_133m i,se 3.3 v tolerant inputs for input/out put frequency selection. an external pull-up or pull-down resistor is attach ed to this pin to select the input/ output frequency. high = 100 mhz output low = 133 mhz output 4 hbw_bypass_lbw i, se tri-level input for selecting the pll bandwidth or bypass mode. high = high bw mode med = bypass mode low = low bw mode 5 pwrgd/pwrdn i 3.3 v lvttl input to power up or power down the device. 6gnd gnd ground for outputs. 7 vddr vdd 3.3 v power supply for differential input receiver. this vddr should be treated as an analog power rail and filtered appropriately. 8 clk_in i, dif 0.7 v differential input. 9 clk_in i, dif 0.7 v differential input. 10 sa_0 i,pu 3.3 v lvttl input selecting the address. tr i-level input. 11 sda i/o open collector smbus data. 12 scl i/o smbus slave clock input. 13 sa_1 i,pu 3.3 v lvttl input selecting the address. tr i-level input. 14 fbout / nc i/o complementary differential feedback output. do not connect this pin to anything. 15 fbout / nc i/o true differential feedback output. do not connect this pin to anything. 16 gnd gnd ground for outputs. 17 dif_0 o, dif 0.7 v differential clock outputs. default is 1:1. 18 dif _0 o, dif 0.7 v differential clock outputs. default is 1:1. 19 dif_1 o, dif 0.7 v differential clock outputs. default is 1:1. 20 dif _1 o, dif 0.7 v differential clock outputs. default is 1:1. 21 vdd_io vdd power supply for differential outputs. 22 gnd gnd ground for outputs. 23 dif_2 o, dif 0.7 v differential clock outputs. default is 1:1. 24 dif _2 o, dif 0.7 v differential clock outputs. default is 1:1.
SI53119 28 rev. 1.1 25 dif_3 o, dif 0.7 v differential clock outputs. default is 1:1. 26 dif _3 o, dif 0.7 v differential clock outputs. default is 1:1. 27 gnd gnd ground for outputs. 28 vdd 3.3 v 3.3 v power supply for outputs. 29 dif_4 o, dif 0.7 v differential clock outputs. default is 1:1. 30 dif _4 o, dif 0.7 v differential clock outputs. default is 1:1. 31 dif_5 o, dif 0.7 v differential clock outputs. default is 1:1. 32 dif _5 o, dif 0.7 v differential clock outputs. default is 1:1. 33 vdd_io vdd power supply for differential outputs. 34 gnd gnd ground for outputs. 35 dif_6 o, dif 0.7 v differential clock outputs. default is 1:1. 36 dif _6 o, dif 0.7 v differential clock outputs. default is 1:1. 37 dif_7 o, dif 0.7 v differential clock outputs. default is 1:1. 38 dif _7 o, dif 0.7 v differential clock outputs. default is 1:1. 39 gnd gnd ground for outputs. 40 vdd_io vdd power supply for differential outputs. 41 dif_8 o, dif 0.7 v differential clock outputs. default is 1:1. 42 dif _8 o, dif 0.7 v differential clock outputs. default is 1:1. 43 dif_9 o, dif 0.7 v differential clock outputs. default is 1:1. 44 dif _9 o, dif 0.7 v differential clock outputs. default is 1:1. 45 vdd 3.3 v 3.3 v power supply for outputs. 46 gnd gnd ground for outputs. 47 dif_10 o, dif 0.7 v differential clock outputs. default is 1:1. 48 dif_10 o, dif 0.7 v differential clock outputs. default is 1:1. 49 dif_11 o, dif 0.7 v differential clock outputs. default is 1:1. 50 dif _11 o, dif 0.7 v differential clock outputs. default is 1:1. 51 gnd gnd ground for outputs. 52 vdd_io vdd power supply for differential outputs. 53 dif_12 o, dif 0.7 v differential clock outputs. default is 1:1. table 25. SI53119 72-pin qfn descriptions (continued) pin # name type description
SI53119 rev. 1.1 29 54 dif _12 o, dif 0.7 v differential clock outputs. default is 1:1. 55 dif_13 o, dif 0.7 v differential clock outputs. default is 1:1. 56 dif _13 o, dif 0.7 v differential clock outputs. default is 1:1. 57 vdd_io vdd power supply for differential outputs. 58 gnd gnd ground for outputs. 59 dif_14 o, dif 0.7 v differential clock outputs. default is 1:1. 60 dif _14 o, dif 0.7 v differential clock outputs. default is 1:1. 61 dif_15 o, dif 0.7 v differential clock outputs. default is 1:1. 62 dif _15 o, dif 0.7 v differential clock outputs. default is 1:1. 63 gnd gnd ground for outputs. 64 vdd 3.3 v 3.3 v power supply for outputs. 65 dif_16 o, dif 0.7 v differential clock outputs. default is 1:1. 66 dif _16 o, dif 0.7 v differential clock outputs. default is 1:1. 67 dif_17 o, dif 0.7 v differential clock outputs. default is 1:1. 68 dif _17 o, dif 0.7 v differential clock outputs. default is 1:1. 69 vdd_io vdd power supply for differential outputs. 70 gnd gnd ground for outputs. 71 dif_18 o, dif 0.7 v differential clock outputs. default is 1:1. 72 dif _18 o, dif 0.7 v differential clock outputs. default is 1:1. 73 gnd gnd ground for outputs. table 25. SI53119 72-pin qfn descriptions (continued) pin # name type description
SI53119 30 rev. 1.1 6. power filtering example 6.1. ferrite bead power filtering recommended ferrite bead filtering equivalent to the following: 600 ? impedance at 100 mhz, < 0.1 ? dcr max., > 400 ma current rating. figure 11. schematic example of the SI53119 power filtering
SI53119 rev. 1.1 31 7. ordering guide part number package type temperature lead-free SI53119-a01agm 72-pin qfn extended, ?40 to 85 ? c SI53119-a01agmr 72-pin qfn?tape and reel extended, ?40 to 85 ? c
SI53119 32 rev. 1.1 8. package outline figure 12 illustrates the package details for the SI53119. table 26 lists the valu es for the dimensions shown in the illustration. figure 12. 72-pin quad flat no lead (qfn) package table 26. package dimensions dimension min nom max dimension min nom max a 0.80 0.85 0.90 e2 5.90 6.00 6.10 a1 0.00 0.02 0.05 l 0.30 0.40 0.50 b 0.18 0.25 0.30 aaa 0.10 d 10.00 bsc. bbb 0.10 d2 5.90 6.00 6.10 ccc 0.08 e 0.50 bsc. ddd 0.10 e 10.00 bsc. eee 0.05 notes: 1. all dimensions shown are in milli meters (mm) unless otherwise noted. 2. dimensioning and tolerancing per ansi y14.5m-1994. 3. this drawing conforms to jedec outline mo-220 4. recommended card reflow profile is per the jedec/ip c j-std-020 specification for small body components.
SI53119 rev. 1.1 33 9. land pattern: 72-pin qfn figure 13 shows the recommended land pattern details for the SI53119 in a 72-pin qfn package. table 27 lists the values for the dimensions shown in the illustration. figure 13. 72-pin qfn land pattern ? table 27. pcb land pattern dimensions dimension mm c1 9.90 c2 9.90 e0.50 x1 0.30 y1 0.85 x2 6.10 y2 6.10
SI53119 34 rev. 1.1 d ocument c hange l ist revision 0.9 to revision 1.0 ? corrected specs in table 6, ?phase jitter,? on page 8. revision 1.0 to revision 1.1 ? updated features on page 1. ? updated description on page 1. ? updated specs in table 6, ?phase jitter,? on page 8.
disclaimer silicon laboratories intends to provide customers with the latest, accurate, and in-depth documentation of all peripherals and modules available for system and software implementers using or intending to use the silicon laboratories products. characterization data, available modules and peripherals, memory sizes and memory addresses refer to each specific device, and "typical" parameters provided can and do vary in different applications. application examples described herein are for illustrative purposes only. silicon laboratories reserves the right to make changes without further notice and limitation to product information, specifications, and descriptions herein, and does not give warranties as to the accuracy or completeness of the included information. silicon laboratories shall have no liability for the consequences of use of the information supplied herein. this document does not imply or express copyright licenses granted hereunder to design or fabricate any integrated circuits. the products must not be used within any life support system without the specific written consent of silicon laboratories. a "life support system" is any product or system intended to support or sustain life and/or health, which, if it fails, can be reasonably expected to result in significant personal injury or death. silicon laboratories products are generally not intended for military applications. silicon laboratories products shall under no circumstances be used in weapons of mass destruction including (but not limited to) nuclear, biological or chemical weapons, or missiles capable of delivering such weapons. trademark information silicon laboratories inc., silicon laboratories, silicon labs, silabs and the silicon labs logo, cmems?, efm, efm32, efr, energy micro, energy micro logo and combinations thereof, "the world?s most energy friendly microcontrollers", ember?, ezlink?, ezmac?, ezradio?, ezradiopro?, dspll?, isomodem ?, precision32?, proslic?, siphy?, usbxpress? and others are trademarks or registered trademarks of silicon laboratories inc. arm, cortex, cortex-m3 and thumb are trademarks or registered trademarks of arm holdings. keil is a registered trademark of arm limited. all other products or brand names mentioned herein are trademarks of their respective holders. http://www.silabs.com silicon laboratories inc. 400 west cesar chavez austin, tx 78701 usa clockbuilder pro one-click access to timing tools, documentation, software, source code libraries & more. available for windows and ios (cbgo only). www.silabs.com/cbpro timing portfolio www.silabs.com/timing sw/hw www.silabs.com/cbpro quality www.silabs.com/quality support and community community.silabs.com

▲Up To Search▲

Price & Availability of SI53119

	To Download SI53119 Datasheet File
If you can't view the Datasheet, Please click here to try to view without PDF Reader .